Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-22
2005-02-22
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C029S825000, C324S765010
Reexamination Certificate
active
06859053
ABSTRACT:
In a probe apparatus comprising an inspecting device, an intermediate substrate and a probe substrate, in which the inspecting device is electrically connected to a proximal end of the intermediate substrate, and the intermediate substrate has a distal end electrically connected to a proximal end of the probe substrate, and the probe substrate has a distal end electrically connectable to a substrate under inspection, a plurality of probe substrates are electrically connected to the single intermediate substrate. When a particular probe substrate4is damaged, only the particular probe substrate4may be changed, the other probe substrates4continuing to be used, thereby achieving economy.
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International Search Report PCT/JP00/08024 mailed on Feb. 20, 2001.
Akita Masanori
Mimura Koichi
Murai Fujio
Sato Kenji
Wada Hiromitu
Karlsen Ernest
Toray Engineering Co., Ltd.
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