Probe apparatus for use in both high and low frequency measureme

Details Probe apparatus for use in both high and low frequency measureme Probe apparatus for use in both high and low frequency measureme

1995-02-02

1997-10-21

Regan, Maura K.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324128, 324520, 333 81A, G01R 3102

Patent

active

056800398

ABSTRACT:
This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.

REFERENCES:
patent: 2131101 (1938-09-01), Ferris
patent: 3532982 (1970-10-01), Zeidlhack et al.
patent: 3701037 (1972-10-01), Hoer
patent: 3875537 (1975-04-01), Dolby
patent: 4051432 (1977-09-01), Sarjeant
patent: 4418314 (1983-11-01), Nieto, Jr.
patent: 4473857 (1984-09-01), Winter
patent: 4507618 (1985-03-01), Nelson
patent: 5107201 (1992-04-01), Ogle
patent: 5172051 (1992-12-01), Zamborelli

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