Probe apparatus for testing electronic circuits immersed in a li

Details Probe apparatus for testing electronic circuits immersed in a li Probe apparatus for testing electronic circuits immersed in a li

1992-01-27

1993-08-24

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 3500, G01R 3106

Patent

active

052392619

ABSTRACT:
A mechanical holder for receiving an integrated circuit chip and an etched circuit board probe and holding them in predetermined relative positions includes an alignment block including alignment elements and having a main surface against which the probe is positioned, and a chip receiver having a main surface and including alignment elements that are complementary to the alignment elements of the alignment member. The chip receiver is attached to the alignment member with the main surface of the chip receiver in confronting relationship with the main surface of the alignment member and with the alignment elements of the chip receiver in registration with the alignment elements of the alignment member. The chip receiver defines a cavity that opens at its main surface. A pusher block is fitted in the cavity of the chip receiver in a manner permitting translation of the pusher block perpendicular to the main surface of the chip receiver and also permitting limited tilting movement of the pusher block in the cavity about at least one axis parallel to the main surface of the chip receiver. A spring urges the pusher block towards the alignment member when the chip receiver is attached to the alignment member.

REFERENCES:
patent: 3710251 (1973-01-01), Hagge et al.
patent: 3984222 (1976-10-01), DeHaan
patent: 4897762 (1990-01-01), Daikoku et al.
patent: 4950181 (1990-08-01), Porter
patent: 4954774 (1990-09-01), Binet
patent: 4982153 (1991-01-01), Collins et al.

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