Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-11-23
1997-07-01
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, G01R 3102
Patent
active
056442459
ABSTRACT:
A probe apparatus for inspecting electrical characteristics of a microelectronic element formed on a substrate and having a plurality of pads including a probe card having a plurality of probe needles, an image pick-up device for picking up images of the pads and the probe needles, a registration device which previously stores pad position information indicating pad positions of at least specified of the pads and needle position information indicating needle positions of at least specified of the plurality of probe needles, the needle positions being obtained by an actual measurement based on the images picked up by the image pick-up device, and a control processor for executing a task for detecting imaginary needle marks formed on the pads by imaginarily bringing the specified probe needles and the pads corresponding thereto into contact with each other, by overlapping the first position information and the pad position information of the microelectronic element, a task for detecting positional deviation information indicating a positional deviation between the needle marks and the pads, and a task for correcting a positional deviation between the pads and the probe needles in accordance with the positional deviation information.
REFERENCES:
patent: 4786867 (1988-11-01), Yamatsu
patent: 4929893 (1990-05-01), Sato et al.
patent: 4934064 (1990-06-01), Yamaguchi et al.
patent: 4965515 (1990-10-01), Karasawa
patent: 5436571 (1995-07-01), Karasawa
Saitoh Satoshi
Terada Akihiro
Nguyen Vinh P.
Tokyo Electron FE Limited
Tokyo Electron Limited
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