Probe apparatus for in place testing of electrical circuit board

Details Probe apparatus for in place testing of electrical circuit board Probe apparatus for in place testing of electrical circuit board

1977-02-03

1978-07-04

Rolinec, Rudolph V.

Electricity: measuring and testing

Plural, automatically sequential tests

324158P, 324 725, G01R 3102

Patent

active

040991199

ABSTRACT:
Probe apparatus is disclosed for in place testing of circuit boards of the type which carry electrical components interconnected at nodes accessible from at least a first side of the board. The probe apparatus may comprise a card which is attached to the circuit board under test adjacent its first side. A probe module, including signal conditioning means and a short interfacing element, is mounted on the card in close proximity to the node of interest. The signal conditioning means and interfacing element may comprise electrical decoupling and signal pick off means capable of sensing signals at the node while minimizing introduction of spurious signals thereto.

REFERENCES:
patent: 3806800 (1974-04-01), Bove et al.
patent: 3975680 (1976-08-01), Webb
patent: 4012693 (1977-03-01), Sullivan
patent: 4045737 (1977-08-01), Coberly

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