Probe apparatus and method for measuring high-frequency signals

Details Probe apparatus and method for measuring high-frequency signals Probe apparatus and method for measuring high-frequency signals

1993-02-26

1995-03-21

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324 725, 324149, 324753, 324754, G01R 3102

Patent

active

053999789

ABSTRACT:
A probe apparatus includes a probe contact connected to a storage capacitance via a photoconductive switch. The photoconductive switch can be operated at high speed by means of a pulsed laser. The laser pulses (L) are synchronized with a moment in the operation cycle of the circuit at which moment the voltage at the point under test is to be measured. After a number of pulses and operation cycles the storage capacitance is charged to the voltage value (V) to be measured. Then, the capacitance does not form a load on the point under test and the voltage (V) can be determined accurately.

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Laser Focus, vol. 19, No. 12, Dec. 1983, by S. Letzter "Advances in Boxcar Averaging Using Digital Techniques".

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