Probe apparatus and method for examining a sample

Details Probe apparatus and method for examining a sample Probe apparatus and method for examining a sample

2008-01-01

2008-01-01

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750010, C324S754120

Reexamination Certificate

active

07315175

ABSTRACT:
A probe for examining a sample (5), the probe including an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).

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