Probe apparatus

Details Probe apparatus Probe apparatus

2007-11-20

2007-11-20

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S765010

Reexamination Certificate

active

11308670

ABSTRACT:
A probe apparatus and a probe system are provided. The probe apparatus uses a larger printed circuit board to dispose a plurality of testers. The layout of each of the testers on the circuit board is modified accordingly, such that more number of the testers can be disposed on the circuit board and the pin count of the probe apparatus is increased. In addition, the probe apparatus can be installed in the test tool. Accordingly, the testing efficiency of the present test tool can be substantially promoted and the cost of the overall testing can be effectively reduced.

REFERENCES:
patent: 5489852 (1996-02-01), Gomez
patent: 5546405 (1996-08-01), Golla
patent: 6034533 (2000-03-01), Tervo et al.
patent: 6114869 (2000-09-01), Williams et al.

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