Probe apparatus

Details Probe apparatus Probe apparatus

1990-12-31

1992-02-04

Noland, Tom

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, 118712, 374 45, 414222, G01R 3126

Patent

active

050862707

ABSTRACT:
A probe apparatus having a measuring section with a first system for electrically measuring an object. A loader section has a second system for carrying objects to the measuring section and a marking section has a third system for marking objects. These sections are independent of each other so that a vibration occurring in one section is not transmitted to the other sections.

REFERENCES:
patent: 2311942 (1943-02-01), Hagenmeyer
patent: 3572400 (1971-03-01), Casner et al.
patent: 3590372 (1971-06-01), DeSantis et al.
patent: 3662881 (1972-05-01), Fineran
patent: 3991302 (1976-11-01), Danner
patent: 4056716 (1977-11-01), Baxter et al.
patent: 4097226 (1978-06-01), Erikson
patent: 4101759 (1978-07-01), Anthony
patent: 4453406 (1984-06-01), Spitzer
patent: 4454585 (1984-06-01), Ele
patent: 4468260 (1984-08-01), Hiramoto
patent: 4500003 (1985-02-01), Cedrone
patent: 4507605 (1985-03-01), Geisel
patent: 4535228 (1985-08-01), Mimura
patent: 4539695 (1985-09-01), La Fiandra
patent: 4545327 (1985-10-01), Campbell
patent: 4550245 (1985-10-01), Arai
patent: 4567432 (1986-01-01), Buol et al.
patent: 4618938 (1986-10-01), Sandland et al.
patent: 4639187 (1987-01-01), Maruyama et al.
patent: 4643629 (1987-02-01), Takahashi et al.
patent: 4649261 (1987-03-01), Sheets
patent: 4658646 (1987-04-01), Bell et al.
patent: 4691831 (1987-09-01), Suzuki et al.
patent: 4729246 (1988-03-01), Melgaard et al.
patent: 4755654 (1988-07-01), Crowley
patent: 4755747 (1988-07-01), Sato
patent: 4758782 (1988-07-01), Kobayashi
patent: 4786867 (1988-11-01), Yamatsu
patent: 4812750 (1989-03-01), Keel et al.
patent: 4812901 (1989-03-01), Karasawa
patent: 4852415 (1989-08-01), Bogatzki et al.
patent: 4875005 (1989-10-01), Terada et al.
patent: 4888549 (1989-12-01), Wilson et al.
patent: 4896869 (1990-01-01), Takekoshi et al.
patent: 4926118 (1990-05-01), O'Connor et al.
patent: 4992729 (1991-02-01), Nadeau
Patent Abstracts of Japan: ABS GRPN. E712; ABS vol. 13, No. 51 ABS pub. date Feb. 6, 1989: Abstract of Japanese pat. no. 63-244637 pub. Oct. 12, 1988.
Patent Abstracts of Japan: GRP No. E711; vol. 13, No. 46, ABS pub. date Feb. 2, 1989; Abstract of Japanese pat. no. 63-240039 pub. 10/5/1988.
Patent Abstracts of Japan: GRP E151, vol. 7, No. 4, ABS pub. date Jan. 8, 1983 Abstract of Japanese Patent No. 52-162441 pub. Oct. 6, 1982 by Aida.
Patent Aabstracts of Japan: GRP E464, vol. 10, No. 376; ABS pub. date Dec. 13, 1986 Abstract of Japanese Pat. No. 61-168236 Pub. Jul. 29, 1986.
Patent Abstracts of Japan: GRP E705, vol. 13, No. 23, ABS pub. date Jan. 19, 1989; Abstract of Jap. Pat. No. 63-226936 pub. Sep. 21, 1988 resulting from application No. 62-60581.

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