Electricity: measuring and testing – Particle precession resonance – Using an electron resonance spectrometer system
Reexamination Certificate
2007-06-14
2011-11-29
Arana, Louis (Department: 2858)
Electricity: measuring and testing
Particle precession resonance
Using an electron resonance spectrometer system
C324S321000
Reexamination Certificate
active
08067937
ABSTRACT:
ESR imaging probe, system, and method are described. The probe is an ex-situ probe, the system comprises the probe and configured for operating the probe, and the method comprises detecting ESR from outside a resonator of the probe. An exemplary embodiment of a probe according to the invention comprises a cooled dielectric resonator, and one sided gradient coils. An exemplary embodiment of the system comprises source current that is configured to supply to the gradient coils currents of up to 100 A in pulses shorter than 1 μsec.
REFERENCES:
patent: 4280096 (1981-07-01), Karthe et al.
patent: 5610522 (1997-03-01), Locatelli et al.
patent: 5889402 (1999-03-01), Kumatoriya et al.
patent: 6704594 (2004-03-01), Blank et al.
patent: 7403008 (2008-07-01), Blank et al.
patent: 2005/0021019 (2005-01-01), Hashimshony et al.
patent: 0399789 (1990-11-01), None
patent: WO 2005/117698 (2005-12-01), None
International Preliminary Report on Patentability Dated Dec. 31, 2008 From the International Bureau of WIPO Re.: Application No. PCT/IL2007/000726.
Blank et al. “A Three-Dimensional Electron Spin Resonance Microscope”, Review of Scientific Instruments, 75(9): 3050-3061, 2004. p. 3055-3056.
Blank et al. “Pulsed Three-Dimensional Electron Spin Resonance Microscopy”, Applied Physics Letters, 85(22): 5430-5432, 2004.
Blank et al. “Transparent Miniature Dielectric Resonator for Electron Paramagnetic Resonance Experiments”, Review of Scientific Instruments, 74(5): 2853-2859, 2003.
Casanova et al. “Two-dimensional Imaging With a Single-Sided NMR Probe”, Journal of Magnetic Resonance, Academic Press, 163(1): 38-45, 2003. Chap.3.1, 3.3, Fig.2.
Sakran et al. “Electron Spin Resonance Microscopic Surface Imaging Using a Microwave Scanning Probe”, Applied Physics Letters, 82(9): 1479-1481, 2003.
Communication Pursuant to Article 94(3) EPC Dated Mar. 10, 2011 From the European Patent Office Re. Application No. 07736465.1.
Egorov et al. “Measuring the Dieletric Permittivity of Sapphire at Temperatures 93-343 K”, Radiophysics and Quantum Electronics, 44(11): 885-891, 2001.
Response Dated Sep. 12, 2011 to Communication Pursuant to Article 94(3) EPC of Mar. 10, 2011 From the European Patent Office Re. Application No. 07736465.1.
Blank Aharon
Shtirberg Lazar
Arana Louis
Technion Research & Development Foundation Ltd.
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