Probe and probe card

Details Probe and probe card Probe and probe card

2006-03-01

2009-10-13

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010, C324S761010

Reexamination Certificate

active

07602203

ABSTRACT:
An object of the present invention is to make it possible that a probe for testing electrical characteristics of an object to be tested is easily attached to a support member such as a contactor. A through hole is formed in the contactor. In the probe, a fitting/locking portion which can be fitted in this through hole is formed. The fitting/locking portion is formed to penetrate the through hole of the contactor and to be locked in the contactor in a state that a tip thereof is in contact with a connecting terminal of a printed wiring board. The fitting/locking portion itself is locked in the contactor by hooking a locking portion thereof to an end face on an upper side of the through hole.

REFERENCES:
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patent: 6859054 (2005-02-01), Zhou et al.
patent: 7134909 (2006-11-01), Baba et al.
patent: 2001/0024890 (2001-09-01), Maruyama et al.
patent: 2002/0000821 (2002-01-01), Haga et al.
patent: 2002/0048973 (2002-04-01), Zhou et al.
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patent: 9-219268 (1997-08-01), None
patent: 2001-305182 (2001-10-01), None
patent: 2003-215161 (2003-07-01), None
patent: WO 03/025589 (2003-03-01), None

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