Probe and method for inspecting an object

Details Probe and method for inspecting an object Probe and method for inspecting an object

1997-06-23

1999-06-22

Williams, Hezron

Measuring and testing

Vibration

By mechanical waves

G01N 924

Patent

active

059152770

ABSTRACT:
The present invention discloses a probe and method for inspecting a complex shaped object having an irregular surface. In this invention, a flexible film of piezoelectric elements is combined with a flexible film of eddy current elements into a single probe. The probe simultaneously inspects the volume and the surface of the object by using the flexible ultrasonic transducer and the flexible eddy current sensor, respectively.

REFERENCES:
patent: 4167878 (1979-09-01), Bottcher et al.
patent: 4217516 (1980-08-01), Iinuma et al.
patent: 4497209 (1985-02-01), Kwun et al.
patent: 4678915 (1987-07-01), Dalquist et al.
patent: 4701659 (1987-10-01), Fujii et al.
patent: 4745809 (1988-05-01), Collins et al.
patent: 4856337 (1989-08-01), Metala et al.
patent: 4955235 (1990-09-01), Metala et al.
patent: 5006801 (1991-04-01), Young
patent: 5025215 (1991-06-01), Pirl
patent: 5047719 (1991-09-01), Johnson et al.
patent: 5062298 (1991-11-01), Falcoff et al.
patent: 5101366 (1992-03-01), Cueman et al.
patent: 5161413 (1992-11-01), Junker et al.
patent: 5182513 (1993-01-01), Young et al.
patent: 5278498 (1994-01-01), Vernon et al.
patent: 5315234 (1994-05-01), Sutton, Jr. et al.
The Modelling and Experimental Study of the Piezofilm Transducer Waveforms in Cylindrical Geometry by Z. Zhang, et al, Review of Progress in Quantitative Nondestructive Evaluation, vol. 11, 1992, pp. 1075-1082.
"NDE of Cylindrically Symmetric Components with Piezofilm Transducers" by David Hsu, et al, Review of Progress in Quantitative Nondestructive Evaluation, vol. 11, 1992, pp. 1083-1090.

Affiliated with

Also associated with

Rating

Probe and method for inspecting an object does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe and method for inspecting an object, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe and method for inspecting an object will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1715949