Probe and electrical connecting apparatus using it

Details Probe and electrical connecting apparatus using it Probe and electrical connecting apparatus using it

2011-04-12

2011-04-12

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755070, C324S750230

Reexamination Certificate

active

07924038

ABSTRACT:
A probe having an alignment mark that is hardly influenced by scraps of an electrode scraped by a probe tip is provided. A probe according to the present invention comprises a base portion having an attaching end and extending in a direction distanced from the attaching end, an arm portion extending from the base portion laterally with a space in the extending direction of the base portion from the attaching end, a probe tip portion protruded from the arm portion and having a probe tip formed on its protruding end, and an alignment mark for alignment of the probe tip. The arm portion has a flat surface area on the opposite side of a side where the attaching end of the base portion is located when seen along the extending direction of the arm portion. The probe tip portion is formed to be protruded from the flat surface area, and the alignment mark is constituted by at least a part of the flat surface area.

REFERENCES:
patent: 6933738 (2005-08-01), Martin et al.
patent: 7449906 (2008-11-01), Miura et al.
patent: 1624308 (2006-02-01), None
patent: 2001-349929 (2001-12-01), None
patent: 2004-340654 (2004-12-01), None
patent: 2005-533263 (2005-11-01), None
patent: WO 2004/015432 (2004-02-01), None
patent: WO 2004/102207 (2004-11-01), None

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