Probe and apparatus for testing electronic components

Details Probe and apparatus for testing electronic components Probe and apparatus for testing electronic components

1996-08-08

1998-04-14

Raevis, Robert

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

H01R 4316

Patent

active

057396965

ABSTRACT:
To facilitate the testing of small electronic components, an improved test probe is disclosed. The basic form of the probe comprises a support body made of at least one strip of circuit board material. A pill-shaped conductive contact is secured to and extends outwardly from a front end of the support body. A conductive layer of the circuit board strip connects the contact to a lead that extends outwardly from a rear end of the support body. A middle part of the support body features a series of thru-cuts that enable the support body to resiliently flex and act like a spring.

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