Probe adapter for electronic device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324758, G01R 1073

Patent

active

055482236

ABSTRACT:
An adapter for a measurement test instrument electrical probe has a flexible dielectric substrate with electrically conductive runs thereon. One end of the conductive runs has first electrical contacts with a pitch geometry corresponding to the pitch geometry of electrical contacts of an electronic device that is electrically connected to a substrate via the electrical contacts of the device. The other end of the conductive runs has second electrical contacts that have a pitch geometry compatible with the electrical probe of the measurement test instrument.

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patent: 3596228 (1971-07-01), Reed et al.
patent: 4065717 (1977-12-01), Kattner et al.
patent: 4636722 (1987-01-01), Ardezzone
patent: 4922192 (1990-05-01), Gross et al.
patent: 4963821 (1990-10-01), Janko et al.
patent: 5087877 (1992-02-01), Frentz et al.

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