Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-02-16
1996-08-20
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, G01R 1073
Patent
active
055482236
ABSTRACT:
An adapter for a measurement test instrument electrical probe has a flexible dielectric substrate with electrically conductive runs thereon. One end of the conductive runs has first electrical contacts with a pitch geometry corresponding to the pitch geometry of electrical contacts of an electronic device that is electrically connected to a substrate via the electrical contacts of the device. The other end of the conductive runs has second electrical contacts that have a pitch geometry compatible with the electrical probe of the measurement test instrument.
REFERENCES:
patent: 3405361 (1968-10-01), Kattner et al.
patent: 3596228 (1971-07-01), Reed et al.
patent: 4065717 (1977-12-01), Kattner et al.
patent: 4636722 (1987-01-01), Ardezzone
patent: 4922192 (1990-05-01), Gross et al.
patent: 4963821 (1990-10-01), Janko et al.
patent: 5087877 (1992-02-01), Frentz et al.
Cole Paul A.
Harry Emory J.
Wright Michael A.
Bucher William K.
Karlsen Ernest F.
Tektronix Inc.
LandOfFree
Probe adapter for electronic device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe adapter for electronic device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe adapter for electronic device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2332711