Probe adapter and holder

Details Probe adapter and holder Probe adapter and holder

1998-10-15

2001-09-04

Metjahic, Safet (Department: 2858)

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

C324S754090, C324S758010

Reexamination Certificate

active

06285180

ABSTRACT:

TECHNICAL FIELD
The present invention relates to electrical testing of printed circuit boards. More particularly, it relates to using a hand held tool such as a probe connected to an oscilloscope or other device to perform signal analysis.
BACKGROUND OF THE INVENTION
Hand held probes are used in characterizing electrical contacts and leads on printed circuit boards. The reliability of results depends oftentimes on the steadiness of the probe user's hands. As printed circuitry becomes denser and more complex, it is increasingly difficult to accurately place and hold a probe in proper alignment during testing. Failure to maintain a probe in proper position for readout leads to the need for repetition and becomes costly in terms of both time and human resources.
It is important to assure integrity of readings as components and leads become smaller. Accurately placing and securely holding a probe in proper alignment reduces the need for repetition and thereby reduces costs associated with testing. A problem sometimes arises when the hands of one operator are not adequate to the tasks of both holding a probe and making real time adjustments to the oscilloscope. An operator is forced into awkward positions and may lose his or her steadiness of grip while trying to view and adjust the oscilloscope. Multiple operators become involved in obtaining a single reading. One must try to hold the probe steady while another tends to oscilloscope adjustments.
It is, therefore, desirable to enable a single operator to reliably place a probe and hold it steady while viewing and adjusting an oscilloscope.
BRIEF SUMMARY OF THE INVENTION
The present invention overcomes the problems noted above in connection with hand held probes by providing apparatus adapted for precise positional adjustment for holding a probe steady during testing of printed circuit boards or the like so that a single operator may both position the probe as well as view and adjust an oscilloscope, or the like, to which the probe is attached.
The apparatus of the present invention comprises a free standing structure including a movable arm to which is connected a cradle for securely holding a probe. The cradle is relatively movable with respect to the arm and the whole may be finely adjusted for maintaining the probe in a precise position selected by the probe user. Once the probe is properly positioned the operator may conclude the test operation with no need to handle the probe until a new test site is to be probed.


REFERENCES:
patent: 3458687 (1969-07-01), Cranch
patent: 3500192 (1970-03-01), Donaher et al.
patent: 5984287 (1999-11-01), Fitzsimmons

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