Probe

Details Probe Probe

2011-01-11

2011-01-11

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07868635

ABSTRACT:
An object is to provide a probe, a probe card, and a testing device which can precisely perform a test for conductive state of a conductive wiring in, for example, a through hole or a contact hole provided in a circuit board. Provided is a probe (10) for performing a test for conductivity of a conductive wiring in a hole such as a through hole or a contact hole provided in a circuit board. The probe (10) is provided with an elastically deformable leg portion (11) and a contact portion (13) provided on a tip side of the leg portion (11) to be brought into contact with the conductive wiring (21) provided in a through hole (22). The contact portion (13) is formed to be in a shape and size so as to be prevented from entering the through hole (22).

REFERENCES:
patent: 3676776 (1972-07-01), Bauer et al.
patent: 3835381 (1974-09-01), Garretson et al.
patent: 3996516 (1976-12-01), Luther
patent: 4245189 (1981-01-01), Wahl et al.
patent: 4307928 (1981-12-01), Petlock, Jr.
patent: 4533203 (1985-08-01), Feldman et al.
patent: 4675600 (1987-06-01), Gergin
patent: 4724383 (1988-02-01), Hart
patent: 4835465 (1989-05-01), Gergin
patent: 5151653 (1992-09-01), Yutori et al.
patent: 5425649 (1995-06-01), Reymond
patent: 5729147 (1998-03-01), Schaff
patent: 5926028 (1999-07-01), Mochizuki
patent: 6249135 (2001-06-01), Maruyama et al.
patent: 7112976 (2006-09-01), Tokumo et al.
patent: 56-56646 (1981-05-01), None
patent: 5-92749 (1993-12-01), None
patent: 6-40869 (1994-05-01), None
patent: 11-51970 (1999-02-01), None

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