Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2004-04-13
2008-10-07
Hollington, Jermele M. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07432726
ABSTRACT:
According to an embodiment, a probe coming into contact with an electrode pad of a measurement object comprises a connection terminal part integrally formed and connected to a substrate, a contact part having a tapered configuration, and a supporting part which supports the contact part. The contact part extending from an end of the supporting part has a sectional configuration which shares at least one side face with the supporting part.
REFERENCES:
patent: 6414501 (2002-07-01), Kim et al.
patent: 6452407 (2002-09-01), Khoury et al.
patent: 6614243 (2003-09-01), Klehn et al.
patent: 6900653 (2005-05-01), Yu et al.
patent: 7161363 (2007-01-01), Gleason et al.
Hirata Yoshihiro
Kawase Kazunori
Okada Kazunori
Ueno Tetsuji
Hollington Jermele M.
Meyertons Eric B.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Nguyen Tung X.
Sumitomo Electric Industries Ltd.
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