Probe

Details Probe Probe

1983-06-14

1986-09-02

Frankfort, Charles

Geometrical instruments

Gauge

Movable contact probe, per se

33558, 33172E, 33169R, G01B 728

Patent

active

046087630

ABSTRACT:
A touch probe construction that enables it to be used in place of tool holders used in existing turning centers to perform workpiece inspection operations without requiring modification of the machine. The probe housing is designed to generally correspond in shape to the tool holders and includes a self-contained battery power supply and transmission circuitry for radiating an infrared signal to a remote receiver head when the probe stylus contacts an object such as a workpiece surface. The probe circuitry is designed so that current drain on the battery is minimized.

REFERENCES:
patent: Re30975 (1982-06-01), Stobbe et al.
patent: 3670243 (1972-06-01), Fougere
patent: 4110611 (1978-08-01), Tann et al.
patent: 4118871 (1978-10-01), Kirkham
patent: 4130941 (1978-12-01), Amsbury
patent: 4203225 (1980-05-01), Nilsson
patent: 4328623 (1982-05-01), Juengel et al.
patent: 4339714 (1982-07-01), Ellis
patent: 4401945 (1983-08-01), Juengel
patent: 4451987 (1984-06-01), Cusack
BlG Zero-Senser trade literature; 6 pages; Catalog No. 1982.
LP2 Probe System trade literature; 2 pages; Renishaw Electrical Limited.
Prototype Performance Specification No. ROS 13-Optically Coupled Probe (OMP/OMM); 24 pages; Renishaw Electrical Limited.

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