Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-08-22
2006-08-22
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S187000, C702S188000
Reexamination Certificate
active
07096153
ABSTRACT:
Principal Component Analysis (PCA) is used to model a process, and clustering techniques are used to group excursions representative of events based on sensor residuals of the PCA model. The PCA model is trained on normal data, and then run on historical data that includes both normal data, and data that contains events. Bad actor data for the events is identified by excursions in Q (residual error) and T2 (unusual variance) statistics from the normal model, resulting in a temporal sequence of bad actor vectors. Clusters of bad actor patterns that resemble one another are formed and then associated with events.
REFERENCES:
patent: 5442562 (1995-08-01), Hopkins et al.
patent: 5680409 (1997-10-01), Qin et al.
patent: 5864773 (1999-01-01), Barna et al.
patent: 6442445 (2002-08-01), Bunkofske et al.
patent: 6594620 (2003-07-01), Qin et al.
patent: 6853920 (2005-02-01), Hsiung et al.
patent: 6865509 (2005-03-01), Hsiung et al.
patent: 2004/0176901 (2004-09-01), Uluyol et al.
patent: 2005/0149297 (2005-07-01), Guralnik et al.
Foslien Wendy K
Guralnik Valerie
Bui Bryan
Fredrick Kris T
Honeywell International , Inc.
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