Prevention of counterfeit markings on semiconductor devices

Stock material or miscellaneous articles – Structurally defined web or sheet – Including aperture

Reexamination Certificate

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C428S137000, C264S400000, C264S916000, C257S797000, C257S048000, C257S788000, C257S790000, C257S787000, C257S678000, C438S014000, C438S015000, C438S016000, C438S126000

Reexamination Certificate

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10212950

ABSTRACT:
A lidded semiconductor device has a first layer applied to the lid, which first layer is chosen of a material which fluoresces upon application of non-visible electromagnetic waves thereto, for example, ultraviolet light. A second layer is provided over the first layer. Openings extend through the second layer and further extend to a substantial depth into the first layer, for example, generally halfway into the first layer, to expose portions of the first layer.

REFERENCES:
patent: 5418855 (1995-05-01), Liang et al.
patent: 5985377 (1999-11-01), Corbett
patent: 6181017 (2001-01-01), Hatchard et al.
patent: 6280797 (2001-08-01), Kuczynski et al.
patent: 6331735 (2001-12-01), Blish et al.
patent: 6339728 (2002-01-01), Nguyen et al.
patent: 6432796 (2002-08-01), Peterson
patent: 6576496 (2003-06-01), Bolken et al.

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