Pressure controlled alignment fixture

Details Pressure controlled alignment fixture Pressure controlled alignment fixture

1998-05-06

2000-05-02

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324757, 324758, 439 73, G01R 3102, G01R 3126

Patent

active

060577002

ABSTRACT:
A test fixture that exhibits relatively low parasitic impedance and inductance characteristics (thereby allowing for high speed --several GHz testing) while capable of high volume testing. The fixture utilizes a high dielectric test substrate with gold test leads for best performance. A two-piece test fixture is aligned with and attached to the substrate, with a layer of vertically conductive material disposed between the substrate and the fixture. A first component of the two-piece test fixture include a central aperture for holding the test package in alignment with the leads formed on the test substrate. A second component of the two-piece test fixture covers the package and exerts a predetermined force on the package leads, thereby inducing conductivity through the vertically conductive material and forming a conduction path from the substrate to the package leads.

REFERENCES:
patent: 4843313 (1989-06-01), Walton
patent: 5206585 (1993-04-01), Chang et al.
patent: 5406211 (1995-04-01), Inoue et al.
patent: 5528466 (1996-06-01), Lim et al.
patent: 5847572 (1998-12-01), Iwasaki et al.

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