Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2007-03-13
2007-03-13
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C702S053000, C702S047000, C340S612000, C340S614000, C340S618000, C340S626000, C073S29000R, C073S292000, C073S299000
Reexamination Certificate
active
11199761
ABSTRACT:
A temperature and pressure measuring circuit is provided. The circuit comprises an uncompensated pressure transducer, an analog-to-digital converter, a reference resistive device, and first and second switches. The transducer has variable resistive devices between first, second, third, and fourth bridge nodes. The analog-to-digital converter has first and second reference inputs and first and second differential inputs. When the first switch couples the first differential input and the third bridge node and the second switch couples the second differential input and a ground, a bridge voltage is measurable and a bridge resistance is ratiometrically determinable. The bridge resistance is employed to calculate a temperature. When the first switch couples the first differential input and the first bridge node and the second switch couples the second differential input and the second bridge node, a differential voltage is measurable. The differential voltage is employed to calculate a pressure.
REFERENCES:
patent: 4766763 (1988-08-01), Kurtz
patent: 5428985 (1995-07-01), Kurtz et al.
patent: 5686826 (1997-11-01), Kurtz et al.
patent: 5756878 (1998-05-01), Muto et al.
patent: 6401541 (2002-06-01), Kurtz
patent: 6700473 (2004-03-01), Kurtz et al.
patent: 2006/0025955 (2006-02-01), Kurtz et al.
U.S. Appl. No. 11/200,335, filed Aug. 9, 2005, Miller et al.
Champion James Robert
Cupples Kenneth Alan
Miller Wojtek
Barlow Jr. John E.
Reinhart Boerner Van Deuren P.C.
Robertshaw Controls Company
Vo Hien
LandOfFree
Pressure and temperature measurement of a piezo-resistive... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pressure and temperature measurement of a piezo-resistive..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pressure and temperature measurement of a piezo-resistive... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3787457