Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-08-30
1997-12-23
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3126
Patent
active
057010870
ABSTRACT:
In a prescaler IC test method for carrying out a characterization test to decide whether or not a prescaler IC is normal by the use of an IC tester for carrying out a predetermined decision operation and a probe card for mounting the prescaler IC kept on a wafer, the prescaler IC carries out a frequency dividing operation on reception of a frequency signal to produce a frequency divided signal. The characterization test comprises the steps of generating the frequency signal to supply the frequency signal to the prescaler IC on reception of a direct current control signal, converting the frequency divided signal into a converted signal having a predetermined signal width and a signal level, detecting a first mean value of the signal level, and supplying the first mean value to the IC tester in the form of a direct current signal. The IC tester is supplied with the first mean value and carries out the predetermined decision operation by the use of the first mean value.
REFERENCES:
patent: 4547724 (1985-10-01), Beazley et al.
patent: 5202626 (1993-04-01), Pham et al.
Kobert Russel M.
NEC Corporation
Nguyen Vinh P.
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