Oscillators – With frequency calibration or testing
Patent
1995-08-24
1996-08-06
Mis, David
Oscillators
With frequency calibration or testing
331 66, 331 68, 331108C, 331158, 331179, H03B 504, H03B 536, H03L 102
Patent
active
055437613
ABSTRACT:
A communication system providing read and write access to analog and digitally controlled calibration and configuration information contained within prepackaged crystal oscillators having a crystal oscillator electrical interface with power (VCC), ground (GND), output enable (OE), and oscillator output (XO) interface pins. An output enable (OE) signal is used to control the activity state of the crystal oscillator output, with a pullup MOSFET connected to the XO pin to detect a logic low level at the XO pin during times when the OE signal is logically inactive. A state machine controls access to a serial shift register having multiple calibration and configuration bits. The calibration and configuration bits are used in performing an oscillator specific calibration and configuration function. The state machine also controls the reads and writes of the calibration and configuration shift register. An analog buffer is used to drive the XO line with an internal analog test point voltage of the crystal oscillator.
REFERENCES:
patent: 5446420 (1995-08-01), Westwick
Dallas Semiconductor Corp
Mis David
LandOfFree
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