Predictive failure analysis and failure isolation using...

Details Predictive failure analysis and failure isolation using... Predictive failure analysis and failure isolation using...

2006-02-21

2006-02-21

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S763010, C340S664000, C361S093800

Reexamination Certificate

active

07003409

ABSTRACT:
A method, system, and computer program for predicting the failure of an electronic circuit. One embodiment of the invention monitors the current utilization, environment conditions, and operating conditions of the electronic circuit. A system manager is altered if the current utilization of the electronic circuit is outside a pass range at the measured environmental conditions and the measured operating conditions of the electronic circuit. The invention may also be configured such that if the electronic circuit fails, the electronic circuit is isolated from among a plurality of potentially failed electronic circuits using the measured current utilization, environment conditions, and operating conditions of the electronic circuit.

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