Predictive applications for devices with thin dielectric...

Details Predictive applications for devices with thin dielectric... Predictive applications for devices with thin dielectric...

2007-06-12

2007-06-12

Sircus, Brian (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

With specific current responsive fault sensor

C324S762010, C324S762010, C702S187000, C702S057000, C702S182000

Reexamination Certificate

active

10930544

ABSTRACT:
It is possible to predict with acceptable accuracy the time to failure of a device having a thin gate dielectric in a field effect transistor. Such prediction is based on the realization that for such thin dielectric multiple dielectric breakdown occurs before device failure ensues and that measurement of the device quiescent current flow provides the information necessary for such prediction. The ability to make reliable prediction allows improvement of device design, manufacture, and use.

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