Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent
1976-03-01
1977-12-27
Buczinski, S. C.
Optics: measuring and testing
Angle measuring or angular axial alignment
With photodetection remote from measured angle
250272, 356 30, 356 31, G01B 1126, G01N 2100
Patent
active
040652114
ABSTRACT:
An X-ray diffraction system for crystal analysis employing laser alignment o reduce errors inherent in the mechanical operation of the goniometer apparatus.
REFERENCES:
patent: 3448265 (1969-06-01), Samuelson
patent: 3880524 (1975-04-01), Dill et al.
Greene et al., J. Phys. E. (Gr. Britain) vol. 5, No. 10, Oct. 1975.
Buczinski S. C.
Edelberg Nathan
Kanars Sheldon
Sharp Daniel
The United States of America as represented by the Secretary of
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