Optics: measuring and testing – By alignment in lateral direction
Patent
1994-02-16
1995-08-01
Turner, Samuel A.
Optics: measuring and testing
By alignment in lateral direction
356375, 356358, 414754, 414757, G01B 1100
Patent
active
054384192
ABSTRACT:
A wafer positioning device providing superior precision in a very thin configuration. Piezoelectric (vs. electrostrictive) solid state actuators provide precise positioning. To provide a thin configuration, the actuators are positioned horizontally. To move the wafer vertically, and to magnify the stroke of the actuators, there are provided displacement transformers. The positioning device provides positioning along four degrees of motion. The device can be mounted onto an x-y table to provide positioning along all six degrees of motion.
REFERENCES:
patent: 4655594 (1987-04-01), Wittekoek et al.
patent: 4887904 (1989-12-01), Nakazato et al.
Kim Bowoo
Kim Yountae
Lee Jong-hyun
Electronics and Telecommunications Research Institute
Turner Samuel A.
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