Precision timed delay measurement using phaselocked CW technique

Details Precision timed delay measurement using phaselocked CW technique Precision timed delay measurement using phaselocked CW technique

1993-03-05

1995-01-24

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324 7653, 324 7654, 324621, 324635, 324644, 324533, 368120, 342127, 342124, G01S 1308

Patent

active

053845412

ABSTRACT:
A method and apparatus for the measuring of a delay in a delay circuit by making a continuous frequency measurement is proposed. The phase-locking of a variable frequency signal applied to the delay circuit allows the user to significantly improve the precision and accuracy of the time delay measurement. A scheme to extract the number of cycles stored in the delay circuit is also disclosed.

REFERENCES:
patent: 3853005 (1974-12-01), Schendel
patent: 3938042 (1976-02-01), Gliever et al.
patent: 3940636 (1976-02-01), Perahia
patent: 3965416 (1976-06-01), Friedman
patent: 4164648 (1979-08-01), Chu
patent: 4503433 (1985-03-01), Tomasi

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