Precision three dimensional profiling and measurement system for

Details Precision three dimensional profiling and measurement system for Precision three dimensional profiling and measurement system for

1991-10-10

1994-09-06

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356376, 356381, 356428, 33522, 33807, 33546, 33553, 348127, 348135, G01N 2190

Patent

active

053453093

ABSTRACT:
A system for generating a solid model of the sidewall of the container. A mandrel selectively holds the container in first and second locations. In the first location, a non-contact measurement apparatus utilizing a digital camera produces digital information for generating a three dimensional sidewall surface profile of the container based upon shadow edge detection. In the second position, a contact measurement apparatus produces information for generating a three dimensional sidewall thickness map of the container. A computer collects the information from the contact and non-contact measurement apparatuses and produces an overall solid model of the sidewall of the container based upon sidewall surface profile and sidewall thickness. The computer generates can tilt, diameter, can ovality, and can squarity information.

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