Measuring and testing – Vibration – By mechanical waves
Patent
1996-04-22
1997-12-23
Williams, Hezron E.
Measuring and testing
Vibration
By mechanical waves
73602, 73620, 73627, 73663, 364563, G01H 500
Patent
active
057009554
ABSTRACT:
An apparatus and method for determination of sample thickness and surface depression utilizing ultrasonic pulses. The sample is held in a predetermined position by a support member having a reference surface. Ultrasonic pulses travel through a medium of known velocity propagation and reflect off the reference surface and a sample surface. Time of flight data of surface echoes are converted to distances between sample surfaces to obtain computer-generated thickness profiles and surface mappings.
REFERENCES:
patent: 3688569 (1972-09-01), Murdoch
patent: 4049954 (1977-09-01), Da Costa Vieira et al.
patent: 4056970 (1977-11-01), Sollish
patent: 4167180 (1979-09-01), Kossoff
patent: 4574637 (1986-03-01), Adler
patent: 4719605 (1988-01-01), Eder et al.
patent: 4976149 (1990-12-01), Ichikawa
patent: 5054321 (1991-10-01), Horvath
patent: 5062297 (1991-11-01), Hashimoto
patent: 5173692 (1992-12-01), Shapiro
patent: 5280719 (1994-01-01), Noss
patent: 5440929 (1995-08-01), Huang
Moller Richard A.
Stone Kent N.
United States of America as represented by the Administrator of
Williams Hezron E.
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