Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate
2007-04-24
2007-04-24
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
C702S155000, C702S158000
Reexamination Certificate
active
11240756
ABSTRACT:
A method for generating a surface profile of a microstructure. The profile is processed to determine positions of at least two edges and an approximate center point of the profiled surface. Segments of points on the determined profile are fit to a straight line centered at the approximate center point. A standard deviation of the fitted points is measured. The length and position of the segment are varied until a minimum standard deviation is determined and the process is repeated for segments having different lengths. The point is determined from the longest segment having a standard deviation approximately equal to the minimum standard deviation of all of the segment lengths.
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Barlow John
Kundu Sujoy
Matsushita Electric Industrial Co. Ltd
RatnerPrestia
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