Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1983-05-31
1987-05-19
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
324 62, G01R 2714
Patent
active
046671498
ABSTRACT:
A large number of applications exists for measuring the resistivity or other properties of ferrous and nonferrous metals, including matching alloys to ensure weld compatibility and measuring weld size to estimate weld strength. In the present invention, a DC current-reversal technique allows for accurate electrical measurement with a 4-point probe, alleviating problems due to surface potentials, thermal effects, and eddy currents that previously rendered such measurements inaccurate. Estimates of thermal conductivity, flaw size and location, among others, can also be obtained.
REFERENCES:
patent: 3365663 (1968-01-01), Yamaguchi
patent: 3474330 (1969-10-01), Dauphinee
patent: 3665302 (1972-05-01), Lees et al.
patent: 4503392 (1985-03-01), Fastrisky et al.
patent: 4503710 (1985-03-01), Oertle et al.
Hinsley, Non-Destructive Testing, 1959, pp. 336-339.
Hallenback et al, Precision Four-Point Probe Resistivity Instrumentation, 1969, p. 736.
Cohen et al, Erratic Welding in Low-Carbon Steels, 2-1981.
Smits, Measurement of Sheet Resistivities with LHC Four-Point Probe, 10-1957, pp. 711-718.
Swartzendruber, Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples, 4-1964, pp. 1-7.
Halliday et al, The D.C. Electrical Potential Method for Crack Length Measurement, pp. 85-112.
Uhlir, The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor Engineering, 8-1954, pp. 105-128.
Kohl, Handbook of Materials and Techniques for Vacuum Devices, 1967, p. 198.
Logan, An A.C. Bridge for Semiconductor Resistivity Measurements Using a Four-Point Probe, 9-1960, pp. 885-919.
Rossiter, An Instrument for Measuring the Resistivity of Metals and Metallic Alloys, Journal of Physics E:Scientific Instruments, vol. 3, No. 7, Jul. 1970, pp. 530-532.
"Electrical Resistance Probe Method for Inservice Inspection", Nuclear Power Education Seminar, Chugoku X-Ray Co., Ltd., Tsutomu Fujimura, The Headquarters of Engineering Services.
"An Apparatus for Four-Probe Specific Resistance Measurement on Epitaxial Silicon Films", Measurement Techniques, vol. 17, No. 11, V. V. Batavin et al, 1974, pp. 1753-1754.
Weast, Handbook of Chemistry and Physics, 51st edition, pp. E126-E128.
Cohen Richard L.
West Kenneth W.
American Telephone and Telegraph Company AT&T Bell Laboratories
Eisenzopf Reinhard J.
Fox James H.
Harvey Jack B.
LandOfFree
Precision nondestructive testing of metals does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Precision nondestructive testing of metals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Precision nondestructive testing of metals will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1567047