Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-03-31
1996-10-22
Gonzalez, Frank
Optics: measuring and testing
By polarized light examination
With light attenuation
356375, 356384, 25055919, 25055924, G01B 1124
Patent
active
055682600
ABSTRACT:
A precision non-contact measurement system for determining the diameter of a curved workpiece includes a non-contact range sensor that is disposed along an orthogonal axial path with respect to the axis of rotation of a precision rotary device on which the workpiece to be measured is mounted so as to determine a radius value of the workpiece disposed along the orthogonal path, and a workpiece measurement processor coupled to receive signals from the range sensor and the precision rotary device so as to correlate a plurality of rotational positions of the workpiece with corresponding respective radius values sensed by the range sensor so as to determine the shape and an integrated diameter of the workpiece, that is a diameter measurement determined from rotation of the workpiece through a selected arc of rotation, typically 360.degree.. The non-contact range sensors typically comprise optical sensors such as laser range sensors and light-emitting-diode (LED) type sensors. The precision rotary device commonly comprises a platen on which the workpiece is disposed and a signal generator for generating a signal corresponding to the rotation position of the workpiece throughout 360.degree. of rotation.
REFERENCES:
patent: 4576482 (1986-03-01), Pryor
patent: 4832496 (1989-05-01), Thomas
patent: 4882497 (1989-11-01), Inoue et al.
patent: 5448361 (1995-09-01), Patton
General Electric Company
Gonzalez Frank
Ingraham Donald S.
Ratliff Reginald A.
Snyder Marvin
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