Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Patent
1995-03-24
1996-10-29
Ngo, Ngan V.
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
257504, 257537, H01L 2900
Patent
active
055699510
ABSTRACT:
Pin electronics for an IC tester are built as an integrated circuit for characterizing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. Typically, an IC tester selects one of several measure resistors, applies a stimulus to a pin of the DUT using an input driver, and measures the current response of the DUT through the related measure resistor. Each measure resistor corresponds to a specific current range and measurement accuracy is proportional to the precision of the selected resistor. Each measure resistor is a series of precision integrated resistors having a very low leakage current. This provides for current measurements of high sensitivity.
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DiPietro David M.
Grace James W.
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