Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1993-06-15
1995-06-27
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
257419, G01R 104
Patent
active
054282977
ABSTRACT:
Pin electronics for an IC tester are built as an integrated circuit for characterizing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. Typically, an IC tester selects one of several measure resistors, applies a stimulus to a pin of the DUT using an input driver, and measures the current response of the DUT through the related measure resistor. Each measure resistor corresponds to a specific current range and measurement accuracy is proportional to the precision of the selected resistor. Each measure resistor is a series of precision integrated resistors having a very low leakage current. This provides for current measurements of high sensitivity.
REFERENCES:
patent: 5189505 (1993-02-01), Bartelink
DiPietro David M.
Grace James W.
Bowser Barry C.
Wieder Kenneth A.
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