Precision contour gage

Geometrical instruments – Gauge – With support for gauged article

Patent

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Details

33555, 33553, 33545, 33572, G01B 520

Patent

active

049760432

ABSTRACT:
An apparatus for gaging the contour of a machined part includes a rotary slide assembly, a kinematic mount to move the apparatus into and out of position for measuring the part while the part is still on the machining apparatus, a linear probe assembly with a suspension arm and a probe assembly including as probe tip for providing a measure of linear displacement of the tip on the surface of the part, a means for changing relative positions between the part and the probe tip, and a means for recording data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip.

REFERENCES:
patent: 3279079 (1966-10-01), Schiler
patent: 3911257 (1975-10-01), Whitehouse et al.
patent: 4209206 (1980-06-01), McMurtry et al.
patent: 4265022 (1981-05-01), Noguchi et al.
patent: 4324049 (1982-04-01), Blose
patent: 4377911 (1983-03-01), Iida et al.
patent: 4679331 (1987-07-01), Koontz

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