Precision cleaning apparatus and method

Cleaning and liquid contact with solids – Apparatus – Automatic controls

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

134 58R, 134113, 1341042, B08B 302

Patent

active

057068402

ABSTRACT:
A precision cleaning apparatus and method. The precision cleaning apparatus includes a cleaning monitor further comprising an acoustic wave cleaning sensor such as a quartz crystal microbalance (QCM), a flexural plate wave (FPW) sensor, a shear horizontal acoustic plate mode (SH--APM) sensor, or a shear horizontal surface acoustic wave (SH--SAW) sensor; and measurement means connectable to the sensor for measuring in-situ one or more electrical response characteristics that vary in response to removal of one or more contaminants from the sensor and a workpiece located adjacent to the sensor during cleaning. Methods are disclosed for precision cleaning of one or more contaminants from a surface of the workpiece by means of the cleaning monitor that determines a state of cleanliness and any residual contamination that may be present after cleaning; and also for determining an effectiveness of a cleaning medium for removing one or more contaminants from a workpiece.

REFERENCES:
patent: 4731154 (1988-03-01), Hazlitt et al.
patent: 4796042 (1989-01-01), Mappin et al.
patent: 4817430 (1989-04-01), Benes
patent: 4872356 (1989-10-01), Barnett et al.
patent: 5069235 (1991-12-01), Vetter et al.
patent: 5102504 (1992-04-01), Saito
patent: 5141009 (1992-08-01), Morabtz
patent: 5201215 (1993-04-01), Granstaff
patent: 5341601 (1994-08-01), Dausch et al.
patent: 5369033 (1994-11-01), Di Milia
patent: 5396178 (1995-03-01), Rybarski
T.W. Schneider and D.A. Buttry, "Electrochemical Quartz Crystal Microbalance Studies of Adsorption and Desorption of Self-Assembled Monolayers of Alkyl Thiols on Gold," Journal of the American Chemical Society, vol. 115, No. 26, pp. 12391-12397, (1993).
S.J. Martin, G.C. Frye, A.J. Ricco, and S.D. Sentura, "Effect of Surface Roughness on the Response of Thickness-Shear Mode Resonators in Liquids," Analytical Chemistry, vol. 65, pp. 2910-2922, Oct. 15, 1993.
J.D. Shoemaker, M. Meltzer, D. Miscovich, D. Montoya, P. Goodrich, and G. Blycker, Cleaning Up Our Act: Alternatives for Hazardous Solvents Used in Cleaning, Lawrence Livermore Laboratory Report No. UCRL-ID-115831, (available from National Technical Information Service, U.S. Department of Commerce, Springfield, VA) Jan. 1994.
V.E.Granstaff and S.J. Martin, "Characterization of a Thickness-Shear Mode Quartz Resonator with Multiple Nonpiezoelectric Layers," Journal of Applied Physics, vol. 75, pp. 1319-1329, Feb. 1, 1994.
P.T. Varineau and D.A. Buttry, "Applications of the Quartz Crystal Microbalance to Electrochemistry. Measurement of Ion and Solvent Populations in Thin Films of Poly(vinylferrocene) as Functions of Redox State," Journal of Physical Chemistry, vol. 91, No. 6, pp. 1292-1295 (1987).
S.J. Martin, V.E. Granstaff, and G.C. Frye, "Characterization of a Quartz Crystal Microbalance with Simultaneous Mass and Liquid Loading," Analytical Chemistry, vol. 63, pp. 2272-2281, Oct. 15, 1991.
U.S. application No. 08/108,935, Wessendorf, filed Aug. 18, 1993.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Precision cleaning apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Precision cleaning apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Precision cleaning apparatus and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-318762

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.