Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-01-18
1991-07-02
Wieder, Kenneth
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324660, 324661, 34087037, 73724, G01R 2726
Patent
active
050288768
ABSTRACT:
A method and means for determining the deflection of a movable element in a transducer by measurement of capacitance. The result is independent of extraneous capacitance between the transducer terminals and the environment, of the magnitude of the transducer capacitance, and of scaling factors within the measurement circuits. The difference and sum of differential capacitances are determined, preferably independently of their individual values, using switching techniques and a common measurement circuit. The ratio of differential capacitances is determined by causing the measurement signal for one capacitance to be inversely proportional to the magnitude of the other capacitance.
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An MOS Switched-Capacitor Readout Amplifier for Capacitive Pressure Sensors, by Y. E. Park and K. D. Wise, 12/1983.
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Dresser Industries Inc.
Mueller Robert W.
Wieder Kenneth
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