Optics: measuring and testing – Angle measuring or angular axial alignment – Sides of angle or axes being aligned transverse to optical...
Patent
1990-07-23
1992-05-05
Evans, F. L.
Optics: measuring and testing
Angle measuring or angular axial alignment
Sides of angle or axes being aligned transverse to optical...
356152, 356373, 364559, G01B 1100
Patent
active
051102102
ABSTRACT:
Optical apparatus for measuring angles to a precision approaching the theoretical optical limit for a fixed aperture. Calculations and measurement of the angle are made on the basis of the displacement of a very detailed waveform on a multi-pixel detector from a known point on the detector. The angle this displacement represents is created by the angular displacement of a dispersive element attached to the object of interest. The beamline comprises an optical source, the dispersive element on the object, and a spectrometer which contains an echelle and the detector. The known point on the detector is established by aligning the beamline to a fiducial angle.
REFERENCES:
patent: 4472054 (1984-09-01), Pouit
Fay Theodore D.
Morgan William F.
Schneider Stanley
Cone Gregory A.
Evans F. L.
McDonnell Douglas Corporation
Scholl John P.
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