Precise pointing alignment of optical probes

Details Precise pointing alignment of optical probes Precise pointing alignment of optical probes

1976-09-21

1978-06-27

Buczinski, S. C.

Optics: measuring and testing

Angle measuring or angular axial alignment

With photodetection remote from measured angle

35 12N, 250203R, 250578, 358104, G01B 1126, G09B 908

Patent

active

040971546

ABSTRACT:
Two camera models are each viewed by an optical probe such that each optical probe views its respective model with the same perspective. To this end both probes are pointed towards a desired point on their respective model boards. A light beam, characterized by a particular light signature, is emitted from the desired point on each board and passed to a detector by the probe associated with that board. Detection is on an array of photosensitive elements arranged such that the X-Y coordinates of the point of impingement of the beam on the array may be determined. The location of each light beam on each detector array is correlated. The pointing of the probes is then adjusted such that when each light beam falls on the same X-Y location on the respective photosensitive element arrays, the optical probes are pointing in the same relative direction and viewing both scale models with the same perspective.

REFERENCES:
patent: 3479454 (1969-11-01), Wolff
patent: 3612761 (1971-10-01), Wolff
patent: 3746454 (1973-07-01), Pace et al.
patent: 3787619 (1974-01-01), Wolff
patent: 3794761 (1974-02-01), Genchi et al.
patent: 3865491 (1975-02-01), Hogan
patent: 3903615 (1975-09-01), Dotsko
patent: 3914540 (1975-10-01), Slater
patent: 3923273 (1975-12-01), Alpers
patent: 4019060 (1977-04-01), Woodman

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