Precise CMOS imager transfer function control for expanded...

Television – Camera – system and detail – Solid-state image sensor

Reexamination Certificate

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Details

C348S294000, C348S310000, C250S208100

Reexamination Certificate

active

07417678

ABSTRACT:
A sense node voltage relating to light intensity incident upon a light-detecting element is measured. To realize this measurement, a first integration reset pulse is generated to enable a resetting of the sense node voltage to a voltage value substantially equal to a reset voltage value associated with the first integration reset pulse, an edge of the first integration reset pulse triggering a beginning of a first integration period. Thereafter, a second integration reset pulse is generated to enable a resetting of the sense node voltage to a voltage value substantially equal to a reset voltage value associated with the second integration reset pulse, an edge of the second integration reset pulse triggering a beginning of a second integration period. Subsequent to the generation of the first integration reset pulse and prior to the generation of the second integration reset pulse, a plurality of intra-period reset pulses is generated to enable resetting of the sense node voltage to a plurality of voltage values, each voltage value being substantially equal to a reset voltage value associated with the generated intra-period reset pulse. The sense node voltage generated in response to incident light intensity is measured only once during an integration period, wherein this measurement takes place subsequent to the generation of the plurality of intra-period reset pulses and prior to the generation of the second integration reset pulse.

REFERENCES:
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patent: 2002/0043610 (2002-04-01), Lee et al.
patent: 2003/0174226 (2003-09-01), Ahn et al.
Decker et al., A 256×256 CMOS Imaging Array with Wide Dynamic Range Pixels and Column-Parallel Digital Output, IEEE Journal of Solid-State Circuits, vol. 33, No. 12, Dec. 1998, pp. 2081-2091.

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