Pre-stressed impact testing device

Details Pre-stressed impact testing device Pre-stressed impact testing device

1982-03-19

1984-04-17

Swisher, S. Clement

Measuring and testing

Testing by impact or shock

Specimen impactor detail

73794, G01N 330

Patent

active

044426976

ABSTRACT:
A pre-stressed impact testing device designed to measure the energy which is absorbed during fracture of metal samples under pre-stressed conditions. The device includes a base portion and a pendulum supporting portion which is positioned thereabove. The base portion includes first and second elongated and horizontally spaced-apart beams having opposite ends with a third beam secured to and extending between the first and second beams at one end thereof. A hydraulic ram is secured to and extends between the other ends of the first and second beams for selectively moving the other ends of the first and second beams away from each other so that the first and second beams will be elastically stressed. Connectors are provided on each of the first and second beams for attachment to the opposite ends of the sample material whereby the sample material will be placed in stress when the first and second beams are elastically stressed. A pendulum is positioned on the pendulum supporting portion for impacting and fracturing the sample material. A recorder is provided for measuring the amount of travel of the pendulum after it fractures the sample material.

REFERENCES:
patent: 2699672 (1955-01-01), Couch et al.
patent: 3157046 (1964-11-01), Orner
patent: 3218847 (1965-11-01), Starer et al.
patent: 3590631 (1971-07-01), Gonze

Affiliated with

Also associated with

Rating

Pre-stressed impact testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pre-stressed impact testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pre-stressed impact testing device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-89547