Pre-biasing technique for a transistor based avalanche circuit i

Details Pre-biasing technique for a transistor based avalanche circuit i Pre-biasing technique for a transistor based avalanche circuit i

1996-08-23

1998-08-04

Felber, Joseph L.

Optics: measuring and testing

Range or remote distance finding

With photodetection

327314, 327325, 250214R, G01C 308

Patent

active

057902445

ABSTRACT:
A pre-biasing technique for a transistor-based avalanche circuit which improves the initial rate of rise in the current applied through a laser diode or other light emitting device in a laser based distance measurement and ranging instrument and, therefore, the sharpness of the leading edge of the laser pulse produced. Since the timing of the flight time of a laser pulse to a target and back to the ranging instrument is determined with reference to the leading edge of the emitted laser pulse, the inherent precision obtainable is enhanced by the production of a sharper leading edge pulse. Through the use of the pre-biasing technique disclosed, the very rapid rise time pulse which may be achieved also allows for the substitution of a much cheaper light emitting diode in lieu of a conventional laser diode in an alternative implementation of a light pulsed-based distance measuring and ranging instrument.

REFERENCES:
patent: 5548112 (1996-08-01), Nakase et al.
patent: 5578815 (1996-11-01), Nakase et al.
patent: 5652651 (1997-07-01), Dunne

Affiliated with

Also associated with

Rating

Pre-biasing technique for a transistor based avalanche circuit i does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pre-biasing technique for a transistor based avalanche circuit i, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pre-biasing technique for a transistor based avalanche circuit i will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1183556