Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate
2006-05-09
2006-05-09
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By alignment in lateral direction
C250S559290, C414S754000
Reexamination Certificate
active
07042568
ABSTRACT:
The present invention is a pre-aligner capable of determining the center of a wafer by casting light onto a wafer that is positioned above a charge-coupled device (CCD). The pre-aligner performs this operation by directing light emitted from a single LED simultaneously onto the wafer and the CCD. The light emitted from the LED is directed through a light guide in order to direct the light onto the wafer and CCD. A lens collimates the light exiting the light guide such that the light, as it passes the wafer's edge, is substantially perpendicular to the wafer's edge. The light guide may be removably secured to the pre-aligner housing for easy installation removal. The pre-aligner is capable of self-calibrate the LED.
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Patent Abstract of Japan, vol. 2002, No. 09, Sep. 4, 2002.
Asyst Technologies, Inc.
Lauchman Layla G.
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