Power supply voltage fluctuation analyzing method

Details Power supply voltage fluctuation analyzing method Power supply voltage fluctuation analyzing method

2005-07-19

2005-07-19

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C716S030000, C716S030000, C365S226000, C365S227000

Reexamination Certificate

active

06920403

ABSTRACT:
There is provided a power supply voltage fluctuation analyzing method which performs power supply voltage fluctuation analysis for a semiconductor product, and the method comprises a step of determining a power consumption distribution in each function cell of the semiconductor product by using a power supply portion position and a ratio of each portion based on stored information of an input library which stores therein the power supply portion position and ratio information for each function cell of the semiconductor product, and allocating a power consumption to each function cell.

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patent: 6253354 (2001-06-01), Kuwano et al.
patent: 6330703 (2001-12-01), Saito et al.
patent: 3054109 (2000-04-01), None
patent: 2000-99561 (2000-04-01), None

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