Power supply device, method, program, recording medium,...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S014000

Reexamination Certificate

active

10536436

ABSTRACT:
It is possible to apply a correct power to a load even when the output impedance and a load impedance of a signal source are different from a characteristic impedance of a transmission line. The power applied to the load can be expressed by a measurement system error factor, a load coefficient X of the load, and an S parameter of the input signal R. Accordingly, a target input signal decision can decide a target value of the S parameter of the input signal R according to the power desired to be applied to the load, the measurement system error factor, and the load coefficient X of the load. Furthermore, an input signal level control section controls the input signal level so that the S parameter of the input signal R has this target value. This is performed by changing the amplification ratio of an amplification ratio variable amplifier. Thus, it is possible to apply a desired power to the load not depending on whether the impedance is matched or not.

REFERENCES:
patent: 5006846 (1991-04-01), Granville et al.
patent: 5047725 (1991-09-01), Strid et al.
patent: 5506789 (1996-04-01), Russell et al.
patent: 6421624 (2002-07-01), Nakayama et al.
patent: 6496785 (2002-12-01), Nakayama et al.
patent: 6552995 (2003-04-01), Nakada
patent: 6836743 (2004-12-01), Blackham et al.
patent: 2-303209 (1990-12-01), None
patent: 11-038054 (1999-02-01), None
patent: 2000-13248 (2000-01-01), None
patent: 2001-272428 (2001-05-01), None
Pattison et al., Characterization and Performance of High Power Packaged Devices, 1999 IEEE, pp. 133-138.
Wei et al., Waveform Measurement Technique and Its Applications to Optimum Loading Studies on Power FETS, 2000 IEEE, pp. 666-669.
English Language Abstract of JP 11-038054.
English Language Abstract of JP 2001-272428.
English Language Abstract of JP 2000-13248.
English Language Abstract of JP 2-303209.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Power supply device, method, program, recording medium,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Power supply device, method, program, recording medium,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Power supply device, method, program, recording medium,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3848919

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.