Power supply circuit and test apparatus

Details Power supply circuit and test apparatus Power supply circuit and test apparatus

2008-03-30

2010-12-07

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07847578

ABSTRACT:
Provided is a power supply circuit that supplies power to a load, including a power supply section that outputs a power supply current, a driver section that receives the power supply current from the power supply section and supplies the load with a load current that is consumed by the load, a capacitor section that is charged by the power supply section and that supplies the driver section with an auxiliary current when the load current is greater than the power supply current, and a transmission path that transmits the power supply current output by the power supply section to the driver section, wherein the capacitor section is disposed between the transmission path and a reference potential. The capacitor section is disposed between a transmission path and a reference potential. Also provided is a test apparatus including the power supply circuit.

REFERENCES:
patent: 4598255 (1986-07-01), Hong
patent: 7091701 (2006-08-01), Turner et al.
patent: 2006-155419 (2006-06-01), None
Tietze, Schenk: Halbleiter-Schaltungstechnik, 8th Edition, Springer-Verlag 1986, p. 509, 510 and 527 (in German).
LM317 Data Sheet, Semiconductor Components industries LLC, Apr. 2004, Rev.7.
German Patent and Trademark Office action dated Jun. 28, 2010—File No. 10 2009 014 649.0-32 citing Non-Patent Literature Documents 1 and 2 above and citing US Patent No. 1 above.

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