Power supply arrangement for integrated circuit tester

Details Power supply arrangement for integrated circuit tester Power supply arrangement for integrated circuit tester

2006-08-01

2006-08-01

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S761010

Reexamination Certificate

active

07084659

ABSTRACT:
A test head for a semiconductor integrated circuit tester, the test head includes a power supply board mounted to a power distribution board and positioned between the power distribution board and a device interface board. The power supply board includes a power supply circuit having power supply input terminals for receiving electrical power at a voltage Vinand force and return terminals for supplying regulated electrical power at a voltage Vout. The power supply board further includes a power connector for connecting the force and return terminals of the power supply circuit to power supply contact elements of the device interface board.

REFERENCES:
patent: 5834946 (1998-11-01), Albrow et al.
patent: 5986447 (1999-11-01), Hanners et al.
patent: 6040691 (2000-03-01), Hanners et al.
patent: 6078187 (2000-06-01), Hanners et al.
patent: 6339338 (2002-01-01), Eldridge et al.

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